Visualizing Electromagnetic Noise:
Equipped with anechoic chambers, we visualize
unwanted noise in automotive PCBs.
Leveraging the powers of
PCB Design + Simulation + Verifiable Measurements
to support product development
EMC Lab Equipment
Emission Evaluation and Diagnosis
| Conducted emissions | Level measurement (current clamp, LISN, terminal voltage, spectrum analyzer 1) |
| Noise source search (near-magnetic field scanner, spectrum analyzer 2) | |
| Common-mode voltage measurement (light-insulated probe, oscilloscope, spectrum analyzer) | |
| Radiated emissions | Level measurement (antenna 1, antenna 2, spectrum analyzer) |
| Wave source examination (directional antenna, spectrum analyzer 1) | |
| Operation check, waveform observation (differential probe, oscilloscope) |
Immunity Evaluation and Diagnosis
| Conducted immunity | BCI level measurement (injection probes, integrated amplifier SG) |
| Direct pin voltage measurement (light-insulated probe, integrated amplifier SG) | |
| Noise intrusion route examination (injection probes, TG spectrum analyzer, scanner) | |
| Electrostatic discharge (ESD) testing | ESD level measurement (ESD tester) |
| Direct pin voltage measurement (light-insulated probe, ESD tester) |
Semiconductor Device Evaluation
| IC-level testing (BISS complicance) |
VDE Standard (jig boards, spectrum analyzer) |
| DPI test (jig boards, integrated amplifier SG) |
| Spectrum analyzer 1 | Keysight N9010A ～26.5GHz |
| Spectrum analyzer 2 | Keysight N9000B ～7.5GHz, TG |
| Antenna 1 | Aaronia 20100E |
| Antenna 2 | Aaronia MDF960X (magnetic field) |
| Antenna 3 | Aaronia 30100 (for observation) |
| Oscilloscope | Tektronix MD04104C Spectrum Analyzer Opt |
| Light-insulated probe | Tektronix TIVH08 |
| Integrated amplifier SG | TESEQ NSG 4070C-40 |
| Injection probe | FCC F-140 |
| ESD tester | Noise research lab ESS-S3011 |
| Vector signal generator | Rohde & Schwarz SMBV100B |
| Functional radio communication tester | Rohde & Schwarz CMW-PS291 |
| Isotropic field probe | NARDA |
| Irradiation antenna | teseq TEM horn |
| BCI probe | FCC F-150-1 |
| Bulk current injection probe fixtures | FCC BCICF-150-1 |
| BCI probe | FCC F-150-2 |
| Bulk current injection probe fixtures | FCC BCICF-150-2 |
| Development tool | National Instruments LabVIEW Professional |
| Option | National Instruments (optGPIB) |
| 3D EMC Noice Scanner | WM9500 |
| Current probe | ETS-Lindgren Model 94111-1 |