EMC Lab

TOP | EMC Lab

電磁ノイズを可視化する「新横浜 Lab」


電波暗室や近磁界スキャナなど最新計測設備を備え、
特に車載製品における不要ノイズの可視化設備の充実を図り、
顧客へのサービスを提供します。

 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 

PCBの設計力+シミュレータの活用力+実測の検証力で製品開発をサポート 

 
 

  
 
 
 

EMC Lab Equipment


Emission Evaluation and Diagnosis
Conducted emissions Level measurement (current clamp, LISN, terminal voltage, spectrum analyzer 1)
Noise source search (near-magnetic field scanner, spectrum analyzer 2)
Common-mode voltage measurement (light-insulated probe, oscilloscope, spectrum analyzer)
Radiated emissions Level measurement (antenna 1, antenna 2, spectrum analyzer)
Wave source examination (directional antenna, spectrum analyzer 1)
Operation check, waveform observation (differential probe, oscilloscope)

 

Immunity Evaluation and Diagnosis
Conducted immunity BCI level measurement (injection probes, integrated amplifier SG)
Direct pin voltage measurement (light-insulated probe, integrated amplifier SG)
Noise intrusion route examination (injection probes, TG spectrum analyzer, scanner)
Electrostatic discharge (ESD) testing ESD level measurement (ESD tester)
Direct pin voltage measurement (light-insulated probe, ESD tester)

 

Semiconductor Device Evaluation
IC-level testing
(BISS complicance)
VDE Standard (jig boards, spectrum analyzer)
DPI test (jig boards, integrated amplifier SG)

 


Spectrum analyzer 1 Keysight N9010A ~26.5GHz
Spectrum analyzer 2 Keysight N9000B ~7.5GHz, TG
Antenna 1 Aaronia 20100E
Antenna 2 Aaronia MDF960X (magnetic field)
Antenna 3 Aaronia 30100 (for observation)
Oscilloscope Tektronix MD04104C Spectrum Analyzer Opt
Light-insulated probe Tektronix TIVH08
Integrated amplifier SG TESEQ NSG 4070C-40
Injection probe FCC F-140
ESD tester  Noise research lab ESS-S3011
Vector signal generator Rohde & Schwarz SMBV100B
Functional radio communication tester Rohde & Schwarz CMW-PS291
Isotropic field probe NARDA
Irradiation antenna teseq TEM horn
BCI probe FCC F-150-1
Bulk current injection probe fixtures FCC BCICF-150-1
BCI probe FCC F-150-2
Bulk current injection probe fixtures FCC BCICF-150-2
Development tool National Instruments LabVIEW Professional
Option National Instruments (optGPIB)

 

お問い合わせ

Contact Us




このたびはUTIに関心をお寄せいただき、ありがとうございます。
ご希望の資料やご質問がございましたら、以下のフォームよりお気軽にお問い合わせください。