電磁ノイズを可視化する
電波暗室や近磁界スキャナなど最新計測設備を備え、
特に車載製品における不要ノイズの可視化設備の充実を図り、
顧客へのサービスを提供します。
PCBの設計力+シミュレータの活用力+実測の検証力で製品開発をサポート



EMC Lab Equipment
Emission Evaluation and Diagnosis
Conducted emissions | Level measurement (current clamp, LISN, terminal voltage, spectrum analyzer 1) |
Noise source search (near-magnetic field scanner, spectrum analyzer 2) | |
Common-mode voltage measurement (light-insulated probe, oscilloscope, spectrum analyzer) | |
Radiated emissions | Level measurement (antenna 1, antenna 2, spectrum analyzer) |
Wave source examination (directional antenna, spectrum analyzer 1) | |
Operation check, waveform observation (differential probe, oscilloscope) |
Immunity Evaluation and Diagnosis
Conducted immunity | BCI level measurement (injection probes, integrated amplifier SG) |
Direct pin voltage measurement (light-insulated probe, integrated amplifier SG) | |
Noise intrusion route examination (injection probes, TG spectrum analyzer, scanner) | |
Electrostatic discharge (ESD) testing | ESD level measurement (ESD tester) |
Direct pin voltage measurement (light-insulated probe, ESD tester) |
Semiconductor Device Evaluation
IC-level testing (BISS complicance) |
VDE Standard (jig boards, spectrum analyzer) |
DPI test (jig boards, integrated amplifier SG) |
Spectrum analyzer 1 | Keysight N9010A ~26.5GHz |
Spectrum analyzer 2 | Keysight N9000B ~7.5GHz, TG |
Antenna 1 | Aaronia 20100E |
Antenna 2 | Aaronia MDF960X (magnetic field) |
Antenna 3 | Aaronia 30100 (for observation) |
Oscilloscope | Tektronix MD04104C Spectrum Analyzer Opt |
Light-insulated probe | Tektronix TIVH08 |
Integrated amplifier SG | TESEQ NSG 4070C-40 |
Injection probe | FCC F-140 |
ESD tester | Noise research lab ESS-S3011 |
Vector signal generator | Rohde & Schwarz SMBV100B |
Functional radio communication tester | Rohde & Schwarz CMW-PS291 |
Isotropic field probe | NARDA |
Irradiation antenna | teseq TEM horn |
BCI probe | FCC F-150-1 |
Bulk current injection probe fixtures | FCC BCICF-150-1 |
BCI probe | FCC F-150-2 |
Bulk current injection probe fixtures | FCC BCICF-150-2 |
Development tool | National Instruments LabVIEW Professional |
Option | National Instruments (optGPIB) |
3D EMC Noice Scanner | WM9500 |
Current probe | ETS-Lindgren Model 94111-1 |